Semiconductor manufacturing is becoming increasingly complex and challenging. Today’s manufacturers must rely on effective process monitoring – but conventional measurement methods alone can no longer guarantee the required quality standards.
This is why measuring force, pressure, and acceleration is emerging as an important factor in many front-end and back-end manufacturing processes: grinding, dicing, polishing, CMP, wafer handling, die sorting, wire bonding, flip-chip, molding and encapsulation, pick-and-place handling, testing – and more. Piezoelectric dynamic measurement is the technology of choice for measuring, monitoring, and controlling mechanical stress, vibration, and pressure deviation in order to improve quality assurance and productivity in semiconductor manufacturing.
Discover how Kistler helps semiconductor manufacturers overcome today’s market challenges. Integrated monitoring solutions based on piezoelectric measurement technology can optimize every stage of semiconductor production - from dicing to bonding. See how direct force measurement effectively prevents issues such as chipping or blade clogging, wire breakage, and damaged mesh connections. Take four minutes to discover how Kistler solutions can increase quality, productivity, and transparency in any semiconductor production line - including yours.
Process monitoring with force measurement technology delivers real added value for semiconductor manufacturing. “Making the invisible visible” - the key to overcoming the challenges of tomorrow’s world.
Piezoelectric measurement technology from Kistler ensures high-resolution monitoring and control of the forces acting in semiconductor manufacturing processes - no matter how small they are.
Conventional measurement may not be able to access force as a physical quantity that can cause equipment faults - but piezoelectric force measurement “makes the invisible visible”.
Process visibility based on dynamic force measurement technology provides impressive benefits for semiconductor manufacturing:
Read more: Piezoelectric dynamic measurement in semiconductor manufacturing | Kistler
Download catalogue: Optimized semiconductor production ; Using piezoelectric sensors to measure dynamic force in semiconductor applications
